Steve Watson (VTO Labs)

Abstract

Radical changes have emerged in the last few years related to the safe removal of storage flash for mobile device forensics. As electronics manufacturing and increased miniaturization has raised the complexity of chip-off for mobile forensics, new techniques have emerged to address new challenges. The workshop will examine recent research related to the traditional removal of storage flash chips using heat. We will also examine recent published techniques for the removal of storage chips using matter subtraction or matter removal. Matter subtraction/removal techniques include milling and lap/polish. After a thorough review of the techniques and existing body of research, the protocols will be compared and contrasted for the audience to judge for themselves which technique will work best for their individual use cases. The workshop will include a live demonstration of heated removal, milling and lap and polish by the presentation team.